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TitleAn analytical protocol for determining the elemental chemistry of Quaternary sediments using a portable X-ray fluorescence spectrometer
AuthorKnight, R D; Kjarsgaard, B A; Russell, H A J
SourceApplied Geochemistry .
Alt SeriesNatural Resources Canada, Contribution Series 20190294
PublisherElsevier
Documentserial
Lang.English
Mediapaper; on-line; digital
ProgramAquifer Assessment & support to mapping, Groundwater Geoscience
Abstract(unpublished)
An analytical protocol for determining the elemental chemistry of Quaternary glaciogenic sediments using a portable X-ray fluorescence spectrometer has been developed using a suite of CRMs/SRMs and sediment samples. The analytical quality of pXRF derived geochemical data is dependent on numerous factors including sample heterogeneity, grain size, moisture content, sample thickness, and instrument specifications such as X-ray tube type and power parameters (keV, mA), and dwell time. This protocol considers: 1) Sample preparation; 2) Analysis, and; 3) Data Examination. The protocol outlines how to collect near definitive, quantitative, and qualitative geochemical data for 41 elements using the pXRF, at a fraction of the cost of traditional laboratory methods. Although the analytical protocol is robust, sample collection and preparation is still the key to a successful geochemical study.
Summary(Plain Language Summary, not published)
An analytical protocol for determining the elemental chemistry of Quaternary glaciogenic sediments using a portable X-ray fluorescence spectrometer has been developed using a suite of CRMs/SRMs and traditional laboratory methods. The protocol (Fig. 7) outlines how to collect high-quality data using the pXRF, at a fraction of the cost of traditional laboratory methods. The pXRF provides elemental concentrations for 33 elements in Soil Mode and 41 elements in Mining Mode. This technology opens new frontiers in geochemical studies by providing rapid elemental analyses of unconsolidated surficial sediments.
GEOSCAN ID315471